Analog Devices' MEMS Accelerometers Enable Early Detection of Structural Defects
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Analog Devices' MEMS Accelerometers Enable Early Detection of Structural Defects (Graphic: Business Wire).
- View the ADXL354 product page, download data sheet, order samples and evaluation boards: http://www.analog.com/ADXL354
- View the ADXL355 product page, download data sheet, order samples and evaluation boards: http://www.analog.com/ADXL355
- Connect with engineers and ADI product experts on EngineerZone®, an online technical support community: https://ez.analog.com/welcome
The ADXL354 and ADXL355 accelerometers offer guaranteed temperature stability with null offset coefficients of 0.15mg/C (max). The stability minimizes resource and expense associated with calibration and testing effort, helping to achieve higher throughput for device OEMs. In addition, the hermetic package helps ensure that the end product conforms to its repeatability and stability specifications long after they leave the factory.
With output of ±2g to ±8g full scale range (FSR), selectable digital filtering from 1 Hz to 1 kHz, and low noise density of 25µ/√Hz at less than 200µA current consumption, the ADXL354 and ADXL355 accelerometers offer performance level comparable to much more expensive devices with less power consumption and BOM cost.
Product Pricing and Availability
| Product | Output Interface |
Sample |
Full |
Price Each |
Packaging | |||||||||
| ADXL354 | Analog | Now | Now |
|
6x6 mm 14- |
|||||||||
| ADXL355 | SPI | Now | Now |
|
6x6 mm 14- |
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linda.kincaid@analog.com
or
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andrew.maclellan@porternovelli.com
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